发明名称 GOLD ALLOY WIRE FOR BONDING ON SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a gold alloy wire supplying improved junctional characteristic at second-side junction upon bonding at a low heating temperature of 150 deg.C, and especially improved peeling strength and vibration breakage performance, so as to improve an effect to prevent breakage even in a case where a semiconductor device using a copper alloy lead frame is exposed to a severe heat-cycle environment, and to obtain a stable loop shape upon bonding. SOLUTION: A gold alloy wire contains 1-50 wt. ppm indium (In), 1-50 wt. ppm tin (Sn), at least one of La, Ce, Eu and Yb of 1-50 wt. ppm, at least one of Ag, Pt, Pd, Rh, Ir, Os and Ru of 1-100 wt. ppm, and a residue of gold and indispensable impurity. Further, at least one of Ca, Ge and Be of 50 wt. ppm or less may be added to the alloy wire material.
申请公布号 JPH10303235(A) 申请公布日期 1998.11.13
申请号 JP19970108961 申请日期 1997.04.25
申请人 TANAKA DENSHI KOGYO KK 发明人 YASUHARA KAZUHIKO
分类号 C22C5/02;H01L21/60 主分类号 C22C5/02
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