发明名称 ATM SWITCH TESTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an ATM switch testing device capable of measuring performance of an ATM cell switch in short time without influencing a user cell and depending on an OAM cell. SOLUTION: Two cell streams with the same contents are formed by a cell copy part 32. A cell for a test generated by a cell for test generating part 34 is inserted into one of the two cell streams and the other is outputted as it is by a cell for test inserting part 11. The cell for the test is extracted from the cell flow into which the cell for the test is inserted among the cell streams outputted from each of ATM switches 39, 40 and outputted to a performance testing part 38 by a cell for test extracting part 12. In addition, the cell flow into which no cell for the test is inserted is outputted as it is to a device output part 36 with an ATM switch selector 35.</p>
申请公布号 JPH10303912(A) 申请公布日期 1998.11.13
申请号 JP19970108525 申请日期 1997.04.25
申请人 NEC CORP 发明人 FUCHIGAMI HIROYUKI
分类号 H04Q3/00;H04L12/26;H04L12/28;(IPC1-7):H04L12/28 主分类号 H04Q3/00
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