发明名称 IGBT with latch-up prevention and short circuit strength
摘要 The insulated gate bipolar transistor includes, on a first layer first surface, formed a second semiconductor layer of second conductivity, while a first semiconductor region (106,108) of first conductivity is formed in a surface of the second layer. In a surface of the first region is formed a second semiconductor region (124) of second conductivity, while an insulating film (114) is located on the first face. The insulating film carries a control electrode (116), while a first main electrode (120) is formed on the second region by a continuous contact section (121). Between the first and second region is formed a third semiconductor region (110) of first conductivity covering almost the entire bottom of the second region. The second region contains three parts (124a,b,c), each of specified design.
申请公布号 DE19810338(A1) 申请公布日期 1998.11.12
申请号 DE1998110338 申请日期 1998.03.10
申请人 SAMSUNG ELECTRONICS CO., LTD., SUWON-CITY, KYUNGKI-DO, KR 发明人 TAE-HOON, KIM, PUCHON, KYUNGGI, KR
分类号 H01L29/78;H01L29/06;H01L29/08;H01L29/68;H01L29/739;(IPC1-7):H01L29/739 主分类号 H01L29/78
代理机构 代理人
主权项
地址