发明名称 Metallization in semiconductor devices
摘要 <p>A method for forming a plurality of electrically conductive wires on a substrate. The method includes forming a relatively non-planar metal layer over a surface of the substrate. A self-planarizing material is deposited over the metal layer. The self-planarizing material forms a planarization layer over the surface of the metal layer. The planarization layer has a surface relatively planar compared to the relatively non-planar metal layer. A photoresist layer is deposited over the surface of the planarization layer. The photoresist layer is patterned with a plurality of grooves to form a mask with such grooves exposing underling portions of the planarization layer. The photoresist mask is used as a mask to etch grooves in the exposed portions of the planarization layer and thereby form a second mask. The second mask exposes underling portions of the relatively non-planar metal layer. The second mask is used to etch grooves in the relatively non-planar conductive metal layer and thereby form the plurality of electrically conductive wires in the metal layer. The wires are separated from each other by the grooves formed in the relatively non-planar metal layer. The planarization layer is formed by a spinning-on an organic polymer, for example an organic polymer having silicon, or a flowable oxide, or a hydrogensilsequioxane, or divinyl-siloxane-benzocyclobutene. The metal layer is etched using reactive ion etching. The planarization layer is removed using a wet chemical etch. &lt;IMAGE&gt;</p>
申请公布号 EP0875928(A2) 申请公布日期 1998.11.04
申请号 EP19980104745 申请日期 1998.03.17
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 TOBBEN, DIRK;SPULER, BRUNO;GUTSCHE, MARTIN;WEIGAND, PETER
分类号 H01L21/302;H01L21/3065;H01L21/3213;H01L21/768;H01L23/12;H05K1/00;H05K3/06;H05K3/22;H05K3/24;(IPC1-7):H01L21/768;H01L21/321 主分类号 H01L21/302
代理机构 代理人
主权项
地址