发明名称 Orientation location system of an observation instrument
摘要 PCT No. PCT/FR95/01130 Sec. 371 Date Feb. 25, 1997 Sec. 102(e) Date Feb. 25, 1997 PCT Filed Aug. 29, 1995 PCT Pub. No. WO96/07120 PCT Pub. Date Mar. 7, 1996An observation instrument located on a satellite is provided with light sources, whose radiation is reflected by the facets of at least one optical dihedron, whose shape is such that it deflects very slightly or not at all the reflected beam, even if it is displaced. Thus, the reflected beam, which is representative of the sighting axis of the instrument is reflected to a sensor, having a known orientation, in order to give the real direction of the axis. The invention has application to locations or tracking on the ground by the instrument.
申请公布号 US5828447(A) 申请公布日期 1998.10.27
申请号 US19970793508 申请日期 1997.02.25
申请人 CENTRE NATIONAL D'ETUDES SPATIALES 发明人 DUCHON, PAUL;OTRIO, GEORGES
分类号 B64G1/22;B64G3/00;G01C1/00;G01C21/02;G01C21/24;G01S5/16;G02B23/16;(IPC1-7):G01B11/26 主分类号 B64G1/22
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