发明名称 Semiconductor tablet handling and storage device for IC testing device
摘要 The device allows a semiconductor tablet to be removed from a storage container (KAS) with an open base and transported to an automatic IC testing device for testing the IC's provided on the tablet, the tested tablets returned to the storage container. A lifting device (14) is raised into alignment with the base of the storage container, which has hooks (12A) for holding the stacked semiconductor tablets (KST), which are temporarily released for removal of the bottom semiconductor tablet, before lowering the lifting device and feeding the removed semiconductor tablet to the testing point.
申请公布号 DE19817123(A1) 申请公布日期 1998.10.22
申请号 DE19981017123 申请日期 1998.04.17
申请人 ADVANTEST CORP., TOKIO/TOKYO, JP 发明人 NAKAMURA, HIROTO, KAZO, SAITAMA, JP
分类号 B65D85/86;B65G49/07;B65G59/06;G01R31/26;G01R31/28;H01L21/677;H05K13/00;(IPC1-7):B65G49/05;B65G47/50;H01L21/68 主分类号 B65D85/86
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