发明名称 |
Multi-probe system for dimensional metrology |
摘要 |
A multi-probe system for dimensional metrology. This system utilizes a probe base that is attachable to a coordinate measuring machine and that includes a plurality of probes mounted at spaced-apart locations on the base. The probes are interconnected with the coordinate measuring machine and generate measurement signals based upon interaction with a workpiece. By providing a plurality of probes on a single assembly, multiple measurements can be made on a workpiece in a single measurement cycle.
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申请公布号 |
US5822877(A) |
申请公布日期 |
1998.10.20 |
申请号 |
US19960670176 |
申请日期 |
1996.06.20 |
申请人 |
BROWN & SHARPE MANUFACTURING COMPANY |
发明人 |
DAI, YUZHONG |
分类号 |
G01B7/012;G01B21/04;(IPC1-7):G01B7/03 |
主分类号 |
G01B7/012 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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