发明名称 TEMPERATURE DETECTING DEVICE FOR NON-VOLATILE MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To improve write-in accuracy of a non-volatile memory. SOLUTION: Write-in voltage VH is applied to specific bit cells constituting an EEPROM at the time of initialization of one chip microcomputer and every prescribed period of after that and it is made an erasing state, after that, an output of a sense amplifier 5 is discriminated by applying read-out voltage VL to the bit cell. When an output of the sense amplifier 5 is a logic value '0', as the movement of accumulated electrons from a floating gate of the bit cell to a gate is insufficient, write-in voltage VH is made high and an output of the sense amplifier is discriminated again. Write-in voltage VH when an output of the sense amplifier 5 is made a logic value '1' is selected as appropriate voltage for erasing an EEPROM.</p>
申请公布号 JPH10275491(A) 申请公布日期 1998.10.13
申请号 JP19970079993 申请日期 1997.03.31
申请人 SANYO ELECTRIC CO LTD 发明人 OSAWA HIROSHI
分类号 G11C16/02;G06F15/78;G11C16/06;(IPC1-7):G11C16/06 主分类号 G11C16/02
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