TIMING GENERATOR OF SEMICONDUCTOR-TESTING DEVICE,申请号JP19970071976-传众专利搜索

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发明名称	TIMING GENERATOR OF SEMICONDUCTOR-TESTING DEVICE
摘要
申请公布号	JPH10268005(A)	申请公布日期	1998.10.09
申请号	JP19970071976	申请日期	1997.03.25
申请人	MITSUBISHI ELECTRIC CORP	发明人	SUGIMOTO MASARU
分类号	G01R31/3183;(IPC1-7):G01R31/318	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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