发明名称 Energy selective detector arrangement esp. X=ray and gamma detector
摘要 The detector arrangement for high energy beams (XR) has a first convertor layer (K1) for converting part of the beam into lower energy secondary radiation of a first wavelength range. It also has a second convertor layer (K2) for converting part of the high energy beam into lower energy radiation of a second wavelength range different from the first. The device also has a verification device (NE) for the secondary radiation for discriminating between the wavelength ranges. The convertor layers and the verification device are arranged one after another in the beam incident direction and are optically coupled. The convertor layers preferably include fluorescent material for high energy radiation. The verification device may have respective photodetectors e.g. series coupled photodiodes sensitive to the different wavelength ranges.
申请公布号 DE19711927(A1) 申请公布日期 1998.09.24
申请号 DE19971011927 申请日期 1997.03.21
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 ROSNER, WOLFGANG, DR.-ING., 83607 HOLZKIRCHEN, DE
分类号 G01T1/20;H01L31/115;(IPC1-7):G01T1/36 主分类号 G01T1/20
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