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发明名称
IC TESTING METHOD AND EQUIPMENT EXECUTING THE SAME
摘要
申请公布号
JPH10239391(A)
申请公布日期
1998.09.11
申请号
JP19970353264
申请日期
1997.12.22
申请人
ADVANTEST CORP
发明人
FURUTA KATSUNOBU
分类号
G01R31/26;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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