发明名称 Piezoelectric vibration sensor with built in test circuit
摘要 <p>A rotation rate sensor which employs a built-in (i.e. internal) test circuit. The rotation rate sensor includes a piezoelectric structure. Deposited on the piezoelectric structure are at least two pickup high and two pickup low electrodes. A pickup circuit is coupled to the pickup high and pickup low electrodes. During a normal mode of operation, the piezoelectric structure is subject to a rotation about one of its axis. In response, the pickup circuit generates a rate signal which corresponds to the rotation rate of the piezoelectric structure. The test circuit is coupled to the pickup low electrodes. During a test mode of operation, the piezoelectric structure is also subject to a rotation about the axis. But, the test circuit generates at the same time a test signal which is provided to the pickup low electrodes and which corresponds to a pseudo rate of rotation. In response, the pickup circuit generates a rate signal which corresponds to the sum of the actual rate of rotation of the piezoelectric material plus the pseudo rate of rotation. <IMAGE></p>
申请公布号 EP0638782(B1) 申请公布日期 1998.09.09
申请号 EP19940305020 申请日期 1994.07.07
申请人 NEW SD, INC. 发明人 FLORIDA, ALVIN V.;GUPTA, PIYUSH K.;MACY, DAVID F.;MORRIS, HAROLD D.
分类号 G01C19/02;G01C19/56;G01C19/5607;G01P9/04;G01P21/00;(IPC1-7):G01C19/56 主分类号 G01C19/02
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