发明名称 Energy dispersive type semiconductor x-ray detector
摘要 An energy dispersive type semiconductor X-ray detector includes an X-ray detection element (7) comprising a high-purity or ultra-pure silicon detection element. The X-ray detection element (7) is cooled by a small-size gas circulation system refrigerator (3), such as a pulse tube system or a Joule-Thomson system, to which it is coupled by a cold finger (5). The detector can be used with an electron microscope as an elemental analyser.
申请公布号 GB2322969(A) 申请公布日期 1998.09.09
申请号 GB19980004839 申请日期 1998.03.06
申请人 * HORIBA LTD 发明人 SHIGETOSHI * ARAI
分类号 G01N23/22;G01T1/24;G01T7/00;H01L31/09;(IPC1-7):H01L31/115;H01L31/024 主分类号 G01N23/22
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