High resolution supply current test system,申请号EP19970870078-传众专利搜索

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发明名称	High resolution supply current test system
摘要
申请公布号	EP0811850(A3)	申请公布日期	1998.09.02
申请号	EP19970870078	申请日期	1997.05.29
申请人	INTERUNIVERSITAIR MICRO-ELEKTRONICA CENTRUM VZW;KATHOLIEKE HOGESCHOOL BRUGGE-OOSTENDE VERENIGING ZONDER WINSTBEJAG	发明人	MANHAEVE, HANS;KERCKENAERE, STEFAAN;STOPJAKOVA, VIERA
分类号	G01R31/26;G01R31/30;(IPC1-7):G01R31/30;G06F1/28	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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