发明名称 PROCESS OF TUNGSTEN CHEMICAL VAPOR DEPOSITION ONTO TITANIUM NITRIDE SUBSTRATE
摘要 A process for chemical vapor deposition of blanket tungsten thin films on titanium nitride proceeds by hydrogen reduction of tungsten hexafluoride at temperatures between 200 DEG C and 500 DEG C. Tungsten film nucleation is preferably facilitated by a plasma treatment of the titanium nitride surface of the substrate, preferably with a hydrogen plasma. The plasma treatment may be carried out in a separate etch chamber and transferred to a tungsten CVD chamber without intervening exposusre to air, or, preferably, is carried out with a low energy etch performed with the substrate mounted on a susceptor in the chamber of the tungsten CVD reactor at which the tungsten film is to be applied.
申请公布号 WO9837579(A1) 申请公布日期 1998.08.27
申请号 WO1998US01425 申请日期 1998.01.26
申请人 TOKYO ELECTRON ARIZONA, INC.;TOKYO ELCTRON LIMITED 发明人 WEBB, DOUGLAS, A.
分类号 H01L21/285;C23C8/02;C23C16/02;C23C16/14;C23C16/34;C23C16/56;C23C28/00;H01L21/28;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/285
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