发明名称 |
PROCESS OF TUNGSTEN CHEMICAL VAPOR DEPOSITION ONTO TITANIUM NITRIDE SUBSTRATE |
摘要 |
A process for chemical vapor deposition of blanket tungsten thin films on titanium nitride proceeds by hydrogen reduction of tungsten hexafluoride at temperatures between 200 DEG C and 500 DEG C. Tungsten film nucleation is preferably facilitated by a plasma treatment of the titanium nitride surface of the substrate, preferably with a hydrogen plasma. The plasma treatment may be carried out in a separate etch chamber and transferred to a tungsten CVD chamber without intervening exposusre to air, or, preferably, is carried out with a low energy etch performed with the substrate mounted on a susceptor in the chamber of the tungsten CVD reactor at which the tungsten film is to be applied.
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申请公布号 |
WO9837579(A1) |
申请公布日期 |
1998.08.27 |
申请号 |
WO1998US01425 |
申请日期 |
1998.01.26 |
申请人 |
TOKYO ELECTRON ARIZONA, INC.;TOKYO ELCTRON LIMITED |
发明人 |
WEBB, DOUGLAS, A. |
分类号 |
H01L21/285;C23C8/02;C23C16/02;C23C16/14;C23C16/34;C23C16/56;C23C28/00;H01L21/28;H01L21/768;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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