发明名称 |
Wafer with opto-electronic circuits and test circuits, and method of testing said wafer |
摘要 |
The test circuit structure includes test integrated circuits (21) spaced amongst integrated circuits without the test function. Whilst the normal structure has photodiodes and electronic blocks, the test integrated circuit structure has a connection field (25) on top of each photodiode (24), allowing the test integrated circuit to be used to verify correct operation of the substrate. |
申请公布号 |
EP0860872(A1) |
申请公布日期 |
1998.08.26 |
申请号 |
EP19970102650 |
申请日期 |
1997.02.19 |
申请人 |
EM MICROELECTRONIC-MARIN SA |
发明人 |
GRANDJEAN, ANDRE;KUNZ, PASCAL |
分类号 |
H01L23/544 |
主分类号 |
H01L23/544 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|