发明名称 RESIST REMOVING METHOD USING OZONE GAS
摘要 PROBLEM TO BE SOLVED: To surely remove a resist film by heating a substrate supporting stage positioned in a treatment chamber to a specific temperature and making an enriched oxone gas to act on a substrate on which the resist film is formed and which is supported in the heated substrate supporting stage. SOLUTION: A substrate carrying a resist film is treated in an ashing chamber 3 by adjusting the temperature ozone gas supplied to the chamber 3 approximately to the room temperature and a substrate supporting stage supporting the substrate in the chamber 3 is heated to a temperature of <=80 deg.C. The heating temperature of the substrate supporting stage is adjusted to <=80 deg.C, because the autolytic ability of ozone abruptly increases when the ambient temperature exceeds 80 deg.C. Therefore, the workability of resist removing work can be improved, because the resist film on the substrate can be removed surely while the temperature on the chamber 3 is maintained at a relatively low temperature and the highly enriched ozone gas can be handled as it is.
申请公布号 JPH10223611(A) 申请公布日期 1998.08.21
申请号 JP19970024639 申请日期 1997.02.07
申请人 IWATANI INTERNATL CORP 发明人 KOIKE KUNIHIKO;INOUE GOICHI
分类号 G03F7/42;H01L21/027;H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 G03F7/42
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