发明名称 METHOD OF ETCHING PLATINUM FILM OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of etching a platinum film for use as a lower electrode of a semiconductor device capacitor. SOLUTION: Utilizing the characteristics that a Ti adhesive layer 106 on a Pt film 108 is etched with an O-rich etching gas to form a TiOx layer serving as an additional etching mask and such TiOx layer 15 formed enough to block the entire mask 110 from corroding, the Pt film 108 is overetched to improve the etching gradient of this film. To form the TiOx film enough to block the mask 110 from corroding, the temp. of a semiconductor substrate 100 is set in a range of 120-300 deg.C.
申请公布号 JPH10223604(A) 申请公布日期 1998.08.21
申请号 JP19980023493 申请日期 1998.02.04
申请人 SAMSUNG ELECTRON CO LTD 发明人 KIN GENYU;NAN HEIIN;SHU HEIZEN;RYU GENSHO
分类号 C23F4/00;H01L21/285;H01L21/302;H01L21/3065;H01L21/3213;H01L21/8242;H01L27/108 主分类号 C23F4/00
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