发明名称 Transistor having zones of different dopant concentration
摘要 Production of a transistor, especially a MOS transistor, involves: (a) applying a first insulating layer (11) onto a first conductivity-type semiconductor substrate region (15); (b) applying a conductive layer (12) and a second insulating layer (13, 14) onto the first insulating layer (11), and then structuring these layers (12, 13, 14) by anisotropic etching; (c) implanting and driving-in a second conductivity-type dopant into the first conductivity-type region (15) to form a second conductivity type first zone (16a); (d) implanting and driving-in another second conductivity-type dopant to form a more heavily doped second conductivity-type second zone (16b); (e) applying and anisotropically back-etching a third insulating layer (17) down to the substrate (3), leaving one or more insulation regions (18); and (f) applying a metallisation layer (19). Also claimed is a transistor, especially a MOS-transistor, having: (i) a semiconductor substrate (3) with a first conductivity-type semiconductor region (15) and second conductivity-type first zones (16a); (ii) a first insulating layer (11) on the substrate surface between the first zones (16a); (iii) a conductive layer (12) and a second insulating layer (13, 14) on the first insulating layer (11); (iv) one or more insulation regions (18) adjacent to the conductive layer (12) on the substrate (3); and (v) two second conductivity-type second zones (16b) adjacent to, and of higher conductivity than, the first zone (16a).
申请公布号 DE19706282(A1) 申请公布日期 1998.08.20
申请号 DE19971006282 申请日期 1997.02.18
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人
分类号 H01L21/336;H01L21/768;H01L29/10;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/336
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