发明名称 Statistical process control integration systems and methods for monitoring manufacturing processes
摘要 A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.
申请公布号 AU6248698(A) 申请公布日期 1998.08.18
申请号 AU19980062486 申请日期 1998.01.27
申请人 CIRCUIT IMAGE SYSTEMS 发明人 JIM KENNEY;JOHN LEON
分类号 G05B19/418 主分类号 G05B19/418
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