发明名称 |
Probe scanner for raster probe microscope |
摘要 |
The scanner has a scanner unit to which a shaft transmits a force to a probe (10) from at least one oscillating coil motor located in an x-direction and one located in a y-direction. It has a selector appliance (52) which employs a metal (62) with a low melting point to provide a selective coupling of a flexible component (51) with the shaft (27). coupling the flexible component and shaft with the control appliance enables a zoom operation to be performed. The control appliance can consist of a cylinder enclosing the metal component with a heater on its outer periphery and the shaft passing through the low melting point metal
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申请公布号 |
DE19804017(A1) |
申请公布日期 |
1998.08.13 |
申请号 |
DE1998104017 |
申请日期 |
1998.02.02 |
申请人 |
SEIKO INSTRUMENTS INC., CHIBA, JP |
发明人 |
YASUTAKE, MASATOSHI, CHIBA, JP |
分类号 |
G01N37/00;G01H1/12;G01H17/00;G01Q10/04;G01Q70/04;G01Q70/08;G01Q70/14;G01Q90/00;G12B1/00;(IPC1-7):H01J37/28 |
主分类号 |
G01N37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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