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经营范围
发明名称
SEMICONDUCTOR TEST DEVICE
摘要
申请公布号
JPH10213623(A)
申请公布日期
1998.08.11
申请号
JP19970014349
申请日期
1997.01.28
申请人
ANDO ELECTRIC CO LTD
发明人
KATAOKA KEIJU
分类号
G01R31/26;G01R19/22;G01R31/28;G01R31/316;(IPC1-7):G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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