发明名称 X-ray mask pellicle
摘要 An X-ray mask pellicle is capable of protecting the X-ray mask from contaminants and the wafer from contact with the X-ray absorber material of the mask. The X-ray mask pellicle is sufficiently thin to allow X-ray exposure at the required mask to wafer gaps yet is sufficiently durable, replaceable, tough and X-ray resistant to be used in X-ray lithography. A thin (organic or inorganic) X-ray mask pellicle to be placed covering the X-ray mask pattern area is fabricated as a thin film and attached to a support ring. A selected area of the pellicle film, tailored to cover the absorber pattern in the X-ray mask, is etched to decrease its thickness to below 2 mu m. If the thin film of the pellicle is not itself conductive, a thin conductive film may be coated on both sides. In an alternative embodiment, the separation between the pellicle and the X-ray mask can be achieved by forming the mask with a stepped profile.
申请公布号 US5793836(A) 申请公布日期 1998.08.11
申请号 US19960716657 申请日期 1996.09.06
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;LOCKHEED MARTIN CORPORATION 发明人 MALDONADO, JUAN R.;ACOSTA, RAUL E.;ANGELOPOULOS, MARIE;DOANY, FUAD E.;NARAYAN, CHANDRASEKHAR;POMERENE, ANDREW T. S.;SHAW, JANE M.;KIMMEL, KURT R.
分类号 G03F1/14;G03F1/16;G03F7/20;H01L21/027;(IPC1-7):H05K1/00 主分类号 G03F1/14
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