| 摘要 |
The coupling between a probe (4) and a hollow waveguide (1) is provided by a wave reflection filter structure (6). This is positioned in the separation plane between the two halves (2,3) of the housing (2,3) of the waveguide, adjacent to the probe. The filter arrangement may have a waffle iron surface structure, and the probe is provided by the inner conductor of a coaxial line, with its outer conductor galvanically connected to the half of the waveguide housing (3) supporting the probe. |
