Solution to mold wire sweep in fine pitch devices

摘要

A method of preventing non-uniform bonding wire sweep during an encapsulating process of an integrated circuit package includes the step of forming an encapsulating material flow restricting element between two widely spaced functional bonding wires. The integrated circuit package includes an array of electrically conductive leads for electrically connecting the package to other electrical elements and an integrated circuit die having a plurality of input/output terminal pads. A plurality of functional bonding wires electrically connects certain ones of the input/output terminal pads to associated electrically conductive leads such that the functional bonding wires have a predetermined pitch which defines an approximate minimum desired spacing between adjacent functional bonding wires. The plurality of functional bonding wires includes two widely spaced functional bonding wires which are spaced apart from one another by a distance substantially greater than the predetermined minimum desired spacing. An encapsulating material surrounds the die, the bonding wires, and at least portions of the leads. The encapsulating material flow restricting element restricts the flow of the encapsulating material in the area between the two widely spaced functional bonding wires during the encapsulating process of the package thereby preventing excessive, non-uniform bonding wire sweep of either of the two widely spaced functional bonding wires during the encapsulating process. In one embodiment, the encapsulating material flow restricting element is at least one additional non-functional bonding wire formed between the two widely spaced functional bonding wires.