发明名称 |
Testable circuit |
摘要 |
A testable circuit comprises a signal path having a time-dependent response behavior (for example, a high-pass filter behavior). The signal path is tested for faults. To this end, the circuit is switched to a test mode in which the signal path is isolated from other signal paths. Subsequently, a test signal containing a signal transition is applied to the input of the signal path and it is tested whether the signal on the output of the signal path at any instant exceeds a threshold level during a predetermined time interval after the transition. The result is loaded into a register and read from the circuit.
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申请公布号 |
US5781559(A) |
申请公布日期 |
1998.07.14 |
申请号 |
US19960734009 |
申请日期 |
1996.10.18 |
申请人 |
U.S. PHILIPS CORPORATION |
发明人 |
MURIS, MATHIAS N. M.;DE JONG, FRANCISCUS G. M.;DE WILDE, JOHANNES;SCHUTTERT, RODGER F. |
分类号 |
G01R31/28;G01R31/3167;G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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