发明名称 Testable circuit
摘要 A testable circuit comprises a signal path having a time-dependent response behavior (for example, a high-pass filter behavior). The signal path is tested for faults. To this end, the circuit is switched to a test mode in which the signal path is isolated from other signal paths. Subsequently, a test signal containing a signal transition is applied to the input of the signal path and it is tested whether the signal on the output of the signal path at any instant exceeds a threshold level during a predetermined time interval after the transition. The result is loaded into a register and read from the circuit.
申请公布号 US5781559(A) 申请公布日期 1998.07.14
申请号 US19960734009 申请日期 1996.10.18
申请人 U.S. PHILIPS CORPORATION 发明人 MURIS, MATHIAS N. M.;DE JONG, FRANCISCUS G. M.;DE WILDE, JOHANNES;SCHUTTERT, RODGER F.
分类号 G01R31/28;G01R31/3167;G01R31/3185;(IPC1-7):G01R31/28 主分类号 G01R31/28
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