发明名称 Circuit arrangement and method for measuring a difference in capacitance between a first capacitance C1 and a second capacitance C2
摘要 The circuit arrangement and method is for measuring a difference in capacitance between a first capacitance (C1) and a second capacitance (C2). A hitherto necessary compensation of a plurality of parasitic effects has become unnecessary due to isolated measurement of an unwanted capacitance (CP) with which parasitic effects, to which the first capacitance (C1) and the second capacitance (C2) are subject, are modelled. When an evaluation logic (AL) realized in digital form is employed, only one counter unit wherein a binary value proportional to the respectively measured capacitance is counted need be provided. By cyclical measurement of the unwanted capacitance (CP), the first capacitance (C1), the second capacitance (C2) and, at the end, the unwanted capacitance (CP) are determined. The unwanted capacitance (CP) is compensated when the counter unit respectively counts backward when "counting" the unwanted capacitance (CP) but otherwise counts forward. Each sub-cycle (T1,T2,T3,T4) lasts exactly N clocks, whereby the clocks are supplied by a measuring oscillator (MO). The clocks are dependent on the capacitance respectively measured.
申请公布号 US5777482(A) 申请公布日期 1998.07.07
申请号 US19960675590 申请日期 1996.07.03
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 TIELERT, REINHARD;HILDEBRANDT, ANDREAS
分类号 G01D18/00;G01R27/26;(IPC1-7):G01R27/26 主分类号 G01D18/00
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