Contact device for testing integrated circuits (ICs)

摘要

The contact device has a contact region (22) to which the integrated circuit (13) is provided. Contacts (25,26) in the form of spaced apart leaf springs are arranged in the contact region (22). The contacts can be connected to the terminals (14) of the integrated circuit (13). Two contacts are provided for each terminal (14). The two contacts for each terminal cooperate in a pincers arrangement. The contacts are set on counter-rotating shafts (16,17) with which a drive means is associated to rotate the contacts on the terminals. Preferably the rotary shafts (16,17) are arranged in one rotary axis (15).