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发明名称
IN-CIRCUIT TESTING APPARATUS
摘要
申请公布号
JPH10170583(A)
申请公布日期
1998.06.26
申请号
JP19960331872
申请日期
1996.12.12
申请人
TESCON:KK
发明人
YOKOGAWA HIROMICHI;UKAI SHUNSUKE
分类号
G01R31/02;G01R31/28;(IPC1-7):G01R31/02
主分类号
G01R31/02
代理机构
代理人
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地址
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