| 摘要 |
Apparatus (100) for a dynamic thermal-mechanical material testing system that not only self-resistively heats and deforms a specimen (170), both under controlled conditions, but also substantially reduces adverse affects in specimen performance, such as magnetically induced motion and non-uniform specimen heating, that would otherwise result from magnetic fields which impinge upon the specimen and are caused by high heating currents flowing in the apparatus. This reduction is achieved by spatially locating high current carrying conductors (102,102') used in the apparatus such that these conductors collectively generate substantially balanced, i.e. substantially equal, and opposite magnetic fields (431,433) that effectively cancel each other out in a volumetric region in the apparatus which contains the specimen and particularly its work zone.
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