发明名称 Arrangement for testing a gate oxide
摘要 PCT No. PCT/DE94/01199 Sec. 371 Date Mar. 27, 1996 Sec. 102(e) Date Mar. 27, 1996 PCT Filed Oct. 6, 1994 PCT Pub. No. WO95/10785 PCT Pub. Date Apr. 20, 1995A circuit arrangement has an integrated monocrystaline semiconductor power component having a gate, a first measuring pad, a second measuring pad, and a resistor arranged so that the gate of the power component is connected with the first measuring pad while the first measuring pad is connected with the resistor, the first measuring pad being charged with a gate test voltage which is greater than a gate voltage required for operation of the power component, the power component being integrated with an integrated circuit on a chip, the integrated circuit being connected with the second measuring pad, while the second measuring pad is connected with the resistor, the second measuring pad being charged with an external voltage which is compatible with the integrated circuit.
申请公布号 US5770947(A) 申请公布日期 1998.06.23
申请号 US19960619755 申请日期 1996.03.27
申请人 ROBERT BOSCH GMBH 发明人 BRAUCHLE, PETER
分类号 G01R31/27;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/27
代理机构 代理人
主权项
地址