发明名称 Scattered-light laser microscope
摘要 PCT No. PCT/DE94/00419 Sec. 371 Date Mar. 21, 1996 Sec. 102(e) Date Mar. 21, 1996 PCT Filed Apr. 19, 1994 PCT Pub. No. WO94/24600 PCT Pub. Date Oct. 27, 1994The invention relates to a method for laser-microscopic magnification of objects, and to a device for implementing the method. In particular, organic, elastic or insulating objects, as well as their surface structures, can be examined down to the nanometer range by this method in a contactless manner and without preparation, and the optical signals generated can be processed with little technical effort. To this end, the specimens are irradiated with a laser beam which has previously been expanded to a larger beam diameter via an expanding lens system (3) and subsequently focused to the smallest possible beam diameter by means of a focusing lens (5) of short focal length. The object can be screened in this context. The intensity of the reflected light and scattered light (6) is detected at a very large solid angle, preferably on the inner surface of one of two hemispherical bowls with direct or indirect photosensors. Optical fibers can be used as photosensors.
申请公布号 US5764364(A) 申请公布日期 1998.06.09
申请号 US19950535207 申请日期 1995.12.18
申请人 IMAB STIFTUNG 发明人 BRUECK, GERNOT K.
分类号 G01N33/483;G01N21/27;G01N33/49;G01Q60/18;G02B21/00;G02B21/06;(IPC1-7):G02B21/00 主分类号 G01N33/483
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