发明名称 Plasma guard for chamber equipped with electrostatic chuck
摘要 A plasma guard member that has the configuration of a flat concentric ring is used in a vacuum process chamber equipped with a plasma reaction chamber, a plasma source and a lower chamber which houses an electrostatic chuck for preventing charged particles from drifting or diffusing to the lower chamber and contact the electrostatic chuck such that the substrate holding capability of the chuck is not adversely affected.
申请公布号 US5762714(A) 申请公布日期 1998.06.09
申请号 US19940324848 申请日期 1994.10.18
申请人 APPLIED MATERIALS, INC. 发明人 MOHN, JON;TSUI, JOSHUA CHIU-WING;COLLINS, KENNETH S.
分类号 B23Q3/15;C23C14/50;C23C16/50;C23F4/00;H01J37/32;H01L21/205;H01L21/302;H01L21/3065;H01L21/31;H01L21/683;(IPC1-7):C23C16/00 主分类号 B23Q3/15
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