发明名称 Semiconductor diamond device having improved metal-diamond contact for excellent operating stability at elevated temperature
摘要 A semiconductor device comprising an electrode formed on a semiconductor diamond. The electrode includes a first metal section which is in contact with a surface of the semiconductor diamond and which has a thickness of 100 nm or smaller, and further including a second metal section which is in contact with the first metal section and which has a thickness of equal to or larger than four times the thickness of the first metal section. The second metal section is made of a metal having a melting point of 1000 DEG C. or higher.
申请公布号 US5757032(A) 申请公布日期 1998.05.26
申请号 US19950510220 申请日期 1995.08.02
申请人 SUMITOMO ELECTRIC INDUSTRIES LTD. 发明人 NISHIBAYASHI, YOSHIKI;SHIOMI, HIROMU;SHIKATA, SHIN-ICHI
分类号 H01L21/28;H01L21/04;H01L29/43;H01L29/47;H01L29/872;(IPC1-7):H01L31/031;H01L23/48;H01L23/52;H01L27/095 主分类号 H01L21/28
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