Apparatus for examining a test object with gamma- or X-ray radiation,申请号EP19900203400-传众专利搜索

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发明名称	Apparatus for examining a test object with gamma- or X-ray radiation
摘要
申请公布号	EP0436986(B1)	申请公布日期	1998.05.20
申请号	EP19900203400	申请日期	1990.12.18
申请人	PHILIPS PATENTVERWALTUNG GMBH;KONINKLIJKE PHILIPS ELECTRONICS N.V.	发明人	KOSANETZKY, JOSEF, DR.;FISCHER, KARL-HEINZ
分类号	G01N23/20;G01N23/203;G01T1/28;G01T7/00;(IPC1-7):G01N23/20	主分类号	G01N23/20
代理机构		代理人
主权项
地址

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