发明名称 |
METHOD FOR MEASURING ABSOLUTE REFLECTANCE BY DOUBLE LIGHT REFLECTION |
摘要 |
PROBLEM TO BE SOLVED: To provide a measuring method, for an absolute reflectance, in which an opaque object is used as an object and whose sensitivity and accuracy are high. SOLUTION: A sample temperature riseΔTac (1) due to only the output light 12 of a light-output laser with reference to a flat boardlike sample 17 as an opaque body is measured. A temperature riseΔTac (2) at the sample 17 due to the output light 12 and due to the re-incidence on the sample of its reflected light 12a measured. The relative reflectance R of the sample 17 is found by R=[ΔTac (2)-ΔTac (1)/ΔTac (1)]. The re-incidence on the sample 17 of the reflected light 12a is performed by using a concave mirror 20 before which a shutter 19 is installed.
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申请公布号 |
JPH10123049(A) |
申请公布日期 |
1998.05.15 |
申请号 |
JP19960297758 |
申请日期 |
1996.10.21 |
申请人 |
AGENCY OF IND SCIENCE & TECHNOL |
发明人 |
KAWATE ETSUO |
分类号 |
G01N21/47;G01N25/00;(IPC1-7):G01N21/47 |
主分类号 |
G01N21/47 |
代理机构 |
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主权项 |
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地址 |
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