发明名称 |
METHOD AND APPARATUS FOR DETECTING PINHOLE |
摘要 |
PROBLEM TO BE SOLVED: To correctly specify the position of a pinhole. SOLUTION: A member to be tested is loaded on an electrode plate 4 fixed onto an upper plate 2a of a base 2 of an apparatus 1. A detecting unit 7 is movable in X-axis and Y-axis directions. An electrode probe 12 for impressing a high voltage to the electrode plate 4 is pressed in a Z-axis direction and brought in touch with the member to be tested. A size of a pressing face of the electrode probe 12 brought in touch with the member to be tested is formed smaller than a wavelength of undulations of the member to be tested. The detecting unit 7 is also provided with a means for measuring a film thickness of the member to be tested. |
申请公布号 |
JPH10123100(A) |
申请公布日期 |
1998.05.15 |
申请号 |
JP19960282190 |
申请日期 |
1996.10.24 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
TAKESHITA YUKITOSHI;ICHINO TOSHIHIRO;NISHI SHIRO |
分类号 |
G01N27/92;G01M3/40;G01N27/20;H01M10/05;H01M10/0565 |
主分类号 |
G01N27/92 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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