MEMORY TEST SYSTEM WITH DEFECT COMPRESSION

摘要

A system for reducing or obviating the requirement for a large amount of defect capture memory in memory test and analysis systems by compressing test results. The compression system reduces or replaces the fault capture memory in the test system or workstation or both, a major cost in test systems, while providing for subsequent regeneration of the test results, either without loss, or with the loss of certain features immaterial to the application.