发明名称 A test probe
摘要 Apparatus for testing the mechanical integrity of a terminal by urging a terminal (18) and test probe (2) together to subject a terminal (18) to a force. A latch (17) is provided to retain a terminal (18) relative to the test probe (2). The latch (17) is arranged so that the apparatus may not be operated to urge the test probe (2) and a terminal (18) together unless the latch (17) is in a position whereby a terminal (18) may be so retained.
申请公布号 AU4563297(A) 申请公布日期 1998.05.11
申请号 AU19970045632 申请日期 1997.10.10
申请人 JACKMARK ENGINEERING LIMITED 发明人 DAVID GRAHAM SUTTON
分类号 G01R31/00;G01R31/04 主分类号 G01R31/00
代理机构 代理人
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