发明名称 OVERVOLTAGE DETECTION CIRCUIT FOR TEST MODE SELECTION
摘要 <p>A supervoltage circuit has been described which uses a resistor divider as an input stage. The resistor divider decreases the dependency of the supervoltage trip point on transistor threshold voltages (Vt). The stability of supervoltage trip point is significantly increased over traditional supervoltage circuits using diode connected transistors as an input stage. The supervoltage circuit can be included in any integrated circuit including memory devices.</p>
申请公布号 WO1998018134(A1) 申请公布日期 1998.04.30
申请号 US1997018734 申请日期 1997.10.21
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