发明名称 Write driver having a test function
摘要 A driver circuit writes data to a memory cell during a write cycle and uncouples the write power terminals from the write terminals during a test mode. The driver circuit includes a first and second data input terminals that typically receive complementary data signals during a write cycle, a test terminal, a write-enable terminal, first and second write power terminals, and first and second write terminals that are coupled to the memory cell. The circuit respectively uncouples the first and second write terminals from the first and second write power terminals when a first signal level, which indicates the test mode, is present on the test terminal. The driver circuit may also couple the first and second write terminals to a reference voltage such as a ground voltage when the first signal level is present on the test terminal.
申请公布号 US5745432(A) 申请公布日期 1998.04.28
申请号 US19960589141 申请日期 1996.01.19
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 MCCLURE, DAVID C.
分类号 G11C7/10;(IPC1-7):G11C8/00;G11C7/00 主分类号 G11C7/10
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