发明名称 PROBE AND MANUFACTURE OF PROBE AND SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To reduce spring constant of an elastic function part of a probe so as to realize a scanning probe microscope having high resolution. SOLUTION: A tip of a probe is pointed, and a stepped part 6 at a boundary between a basic part 5 and an elastic function part 4 is formed into a tapered shape. A diameter of the elastic function part 4 is smaller than a diameter of the basic part 5, and a part of the elastic function part 4 is constricted. Moreover, a probe material is optical fiber and consists of a core part 2 which transmits light and clad parts 3 having different refractive indexes, and a part except a through hole at a tip thereof is covered with a metal film covering 7.
申请公布号 JPH10104244(A) 申请公布日期 1998.04.24
申请号 JP19960340068 申请日期 1996.12.19
申请人 SEIKO INSTR INC 发明人 MURAMATSU HIROSHI;YAMAMOTO NORITAKA;CHIBA TOKUO;NAKAJIMA KUNIO
分类号 G01B11/30;G01N37/00;G01Q20/04;G01Q60/18;G01Q60/22;G01Q60/32;G01Q60/38;G01Q70/10;G01Q70/16;(IPC1-7):G01N37/00 主分类号 G01B11/30
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