摘要 |
An semiconductor device includes an integrated circuit having first and second circuit sections formed on a semiconductor chip (10), at least one voltage stress testing pad (11, 12) formed on the semiconductor chip, for supplying a voltage stress testing voltage or signal to the first circuit section, and a control circuit (15) formed on the semiconductor chip, for controlling and setting the second circuit section into a state corresponding to a voltage stress testing mode by using an input from the voltage stress testing pads. <IMAGE> |
申请人 |
KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP |
发明人 |
TANAKA, HIROAKI, C/O INTELLECTUAL PROPERTY DIV., MINATO-KU, TOKYO 105, JP;KOYANAGI, MASARU, C/O INTELLECTUAL PROPERTY DIV., MINATO-KU, TOKYO 105, JP |