| 摘要 |
PROBLEM TO BE SOLVED: To remarkably improve inspection capacity and inspection accuracy by processing even quantitative information by a specific item inspection circuit or the like. SOLUTION: When respective integrated circuits 1 and a wiring condition of the respective integrated circuits 1 or the like are inspected with ordinary accuracy, a respective input side BS cell circuit 3 and a respective output side BS cell circuit 5 are put in an ordinary boundary scan test mode, and a set of test data and tes result data are taken out in a test procedure in the same as usual, and the respective integrated circuits 1 and a wiring condition or the like are inspected, and when an inspection of the respective integrated circuits 1 and an inspection of an input signal or the like are performed with detailed accuracy, the respective input side BS cell circuit 3 and the respective output side BS cell circuit 5 are put in a detailed boundary scan test mode, and an input signal is analyzed in detail, and an analytical result is taken out, and an inspection of the respective integrated circuits 1 and an inspection of an input signal or the like are performed. Therefore, inspection capacity and inspection accuracy can be remarkably improved without changing a present whole system. |
