Wiring design tool improvement for avoiding electromigration by determining optimal wire widths
摘要
A method for wiring IC chips such that electromigration criteria are met while minimizing the effect on overall chip wireability. A technique to optimize the width of automatically routed wire segments so that these widths are adequate to support the electromigration current on that net as a function of the capacitive loading of the net itself.
申请公布号
US5737580(A)
申请公布日期
1998.04.07
申请号
US19950430670
申请日期
1995.04.28
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
HATHAWAY, DAVID JAMES;KEMERER, DOUGLAS WAYNE;LIVINGSTONE, WILLIAM JOHN;MAINIERO, DANIEL JOSEPH;METZ, JOSEPH LEONARD;PANNER, JEANNIE THERESE HARRIGAN