发明名称 DEVICE FOR TESTING RUN OF FBT
摘要 This invention relates to a life time testing device for a flyback transformer(FBT). A power-supply device(100) is connected to a oscillation substrate(200) generating a constant oscillation frequency and a driving substrate(300) driving FBT. The oscillation substrate(200) is connected to the driving substrate(300). The power-supply device(100) is connected to a switch(SW) and the driving substrate(300) via a primary coil(L1) of FBT. A secondary coil(L2) of FBT is connected to the same load(500) as CRT. The driving substrate(300) is connected to a display(400) in case of an error. The five FBTs can be mounted to proper to a life time testing of a long time.
申请公布号 KR0128446(B1) 申请公布日期 1998.04.02
申请号 KR19930016957 申请日期 1993.08.30
申请人 DAEWOO ELECTRONICS CO.,LTD 发明人 KIM, DONG-SUNG
分类号 (IPC1-7):H04B3/195 主分类号 (IPC1-7):H04B3/195
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