发明名称 |
DEVICE FOR TESTING RUN OF FBT |
摘要 |
This invention relates to a life time testing device for a flyback transformer(FBT). A power-supply device(100) is connected to a oscillation substrate(200) generating a constant oscillation frequency and a driving substrate(300) driving FBT. The oscillation substrate(200) is connected to the driving substrate(300). The power-supply device(100) is connected to a switch(SW) and the driving substrate(300) via a primary coil(L1) of FBT. A secondary coil(L2) of FBT is connected to the same load(500) as CRT. The driving substrate(300) is connected to a display(400) in case of an error. The five FBTs can be mounted to proper to a life time testing of a long time.
|
申请公布号 |
KR0128446(B1) |
申请公布日期 |
1998.04.02 |
申请号 |
KR19930016957 |
申请日期 |
1993.08.30 |
申请人 |
DAEWOO ELECTRONICS CO.,LTD |
发明人 |
KIM, DONG-SUNG |
分类号 |
(IPC1-7):H04B3/195 |
主分类号 |
(IPC1-7):H04B3/195 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|