发明名称 |
Sputtering device for semiconductor component manufacture |
摘要 |
The sputtering device comprises a negative electrode assembly (102) with metal target (10), facing a positive electrode assembly (106), onto which a semiconductor substrate (104) can be deposited. A collimator (108) is located between assemblies near to the semiconductor substrate of a net-like heating material, generating Joule heat on current application. Pref. the positive electrode assembly contains a heat susceptor. In the mfg. process a switching FET is formed with a gate electrode and a source/drain region in an active section of the semiconductor substrate, on which an insulating layer is deposited with etched contact aperture over the source/drain region.
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申请公布号 |
DE19706532(A1) |
申请公布日期 |
1998.04.02 |
申请号 |
DE19971006532 |
申请日期 |
1997.02.19 |
申请人 |
LG SEMICON CO., LTD., CHEONGJU, KR |
发明人 |
LEE, CHANG-JAE, CHEONGJU, KR |
分类号 |
C23C14/34;H01J37/34;H01L21/203;H01L21/285;H01L21/768;(IPC1-7):H01L21/203;H01L21/336 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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