发明名称 METHOD AND INSTRUMENT FOR POLARIZATION MEASUREMENT
摘要 <p>The polarization of fluorescent light or Raman scattering light which is emitted from a sample when light is applied to the sample is measured with high accuracy. Excitation light which is emitted from a pulse excitation light source (1) and is p-polarized by a polarizer (2) and a half-wave plate (3) is applied to a sample (7) and the p-polarization component intensity Ipp and s-polarization component intensity Ips of the emitted fluorescent light are measured by photodetectors (13 and 14). In the same way, s-polarized excitation light is applied to the sample (7) and the p-polarization component intensity Isp and s-polarization component intensity Iss of emitted fluorescent light are measured. The G-factor is obtained from those measured values by a following formula: G = [(Ipp.Isp)/(Ips.Iss)]1/2. Polarization responsiveness correction is performed in accordance with the G-factor to obtain the polarization of the fluorescent light.</p>
申请公布号 WO1998013676(P1) 申请公布日期 1998.04.02
申请号 JP1997003391 申请日期 1997.09.24
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