发明名称 |
Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
摘要 |
To improve testability of analog or mixed analog/digital circuit modules mounted on a carrier, three-way switches are placed at input and output ports of the circuit modules. The switches can operate to establish signal connections between a test bus and core circuits inside the modules. The switches can also establish signal connections between the test bus and glue circuits disposed between the modules. |
申请公布号 |
US5731701(A) |
申请公布日期 |
1998.03.24 |
申请号 |
US19960695469 |
申请日期 |
1996.08.12 |
申请人 |
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION |
发明人 |
LEE, NAI-CHI |
分类号 |
G01R31/316;G01R31/28;G01R31/3167;G01R31/3185;H01L21/66;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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