发明名称 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
摘要 To improve testability of analog or mixed analog/digital circuit modules mounted on a carrier, three-way switches are placed at input and output ports of the circuit modules. The switches can operate to establish signal connections between a test bus and core circuits inside the modules. The switches can also establish signal connections between the test bus and glue circuits disposed between the modules.
申请公布号 US5731701(A) 申请公布日期 1998.03.24
申请号 US19960695469 申请日期 1996.08.12
申请人 PHILIPS ELECTRONICS NORTH AMERICA CORPORATION 发明人 LEE, NAI-CHI
分类号 G01R31/316;G01R31/28;G01R31/3167;G01R31/3185;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/316
代理机构 代理人
主权项
地址