发明名称 Multilayer film structure and vertical cavity surface emitting lasers
摘要 First and second layers are alternately laminated on the semiconductor substrate, providing a multilayer structure in which the resultant residual stress in the layered structure is significantly decreased. One embodiment of the invention is applied to a vertical cavity surface emitting laser having a dielectric multilayer mirror comprised of pairs of a first layer (SiO2 layer) and a second layer (TiO2 layer). Each layer has a prescribed thickness and is formed by deposition on a semiconductor (GaAs) substrate. When the layers are deposited on the semiconductor substrate, the first layer is preferably formed to exhibit a residual compressive stress, while the second layer is preferably formed to exhibit a residual tensile stress having a magnitude that is equal to or almost equal to the residual compressive stress of the first layer.
申请公布号 US5729567(A) 申请公布日期 1998.03.17
申请号 US19960637955 申请日期 1996.04.25
申请人 HEWLETT-PACKARD COMPANY 发明人 NAKAGAWA, SHIGERU
分类号 H01S5/00;G02B5/08;G02B5/26;G02B5/28;H01S5/183;H01S5/32;H01S5/323;H01S5/343;(IPC1-7):H01S3/08;H01L21/20 主分类号 H01S5/00
代理机构 代理人
主权项
地址